［SCM］［SNDM］
Visualizing career distribution in two dimensions
SCM/SNDM is a method that scans the surface of semiconductors using a conductive probe to visualize the carrier distribution in two dimensions. - SCM is sensitive to carrier concentrations of approximately 10^15 to 10^20 cm^-3, while SNDM is sensitive to concentrations of about 10^14 to 10^20 cm^-3. - It is possible to identify the polarity of the semiconductor (p-type/n-type). - A signal correlated with carrier concentration can be obtained, but quantitative evaluation is not possible. - AFM images can also be acquired.
- Company：一般財団法人材料科学技術振興財団 MST
- Price：Other
